Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11257205 | Image measuring method and apparatus | Gyokubu Cho, Koichi Komatsu, Akira Takada, Hiroyuki Yoshida, Takashi Hanamura +2 more | 2022-02-22 |
| 10416863 | Image measuring apparatus and user interface for management of calibration of image measuring apparatus | — | 2019-09-17 |
| 10102631 | Edge detection bias correction value calculation method, edge detection bias correction method, and edge detection bias correcting program | Hiroyuki Yoshida, Akira Takada, Gyokubu Cho, Koichi Komatsu, Hidemitsu Asano +3 more | 2018-10-16 |
| 10024774 | Hardness test apparatus and hardness testing method | Fumihiko Koshimizu, Akira Takada | 2018-07-17 |
| 10001432 | Hardness test apparatus and hardness testing method | Eiji Furuta, Akira Takada | 2018-06-19 |
| 8680428 | Slit width adjusting device and microscope laser processing apparatus | Hidemitsu Asano, Makoto Uwada | 2014-03-25 |