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Crystal, semiconductor element and semiconductor device |
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2025-01-07 |
| 12107125 |
Oxide semiconductor film and semiconductor device |
— |
2024-10-01 |
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Image measuring device |
Kenji Iwamoto, Atsushi Hattori, Junsuke Yasuno, Takaharu Imura |
2023-10-17 |
| D986075 |
Image measuring device |
Kenji Iwamoto, Atsushi Hattori, Junsuke Yasuno, Takaharu Imura |
2023-05-16 |
| D981879 |
Image measuring device |
Kenji Iwamoto, Atsushi Hattori, Junsuke Yasuno, Takaharu Imura |
2023-03-28 |
| 10895449 |
Shape measuring device |
Kentaro Nemoto, Masaoki Yamagata, Hiroaki Kawata |
2021-01-19 |
| 10197374 |
Measuring apparatus |
Kazuhiro Ishizu, Takahiro Ito |
2019-02-05 |
| D806585 |
Image measuring device |
Sadayuki Matsumiya, Yu Sugai, Shigeru Ohtani, Kenji Iwamoto, Atsushi Hattori +1 more |
2018-01-02 |
| D806586 |
Image measuring device |
Sadayuki Matsumiya, Yu Sugai, Shigeru Ohtani, Kenji Iwamoto, Atsushi Hattori +1 more |
2018-01-02 |
| D783424 |
Image measuring device |
Sadayuki Matsumiya, Yu Sugai, Shigeru Ohtani, Kenji Iwamoto, Atsushi Hattori +1 more |
2017-04-11 |