Issued Patents All Time
Showing 1–19 of 19 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9129078 | Static timing analysis of integrated circuit designs with flexible noise and delay models of circuit stages | Igor Keller, King-Ho Tam | 2015-09-08 |
| 8966421 | Static timing analysis methods for integrated circuit designs using a multi-CCC current source model | Igor Keller, Joel R. Phillips, King-Ho Tam | 2015-02-24 |
| 8694934 | Method and apparatus for multi-die thermal analysis | Eddy Pramono, Yong Zhan | 2014-04-08 |
| 8631369 | Methods, systems, and apparatus for timing and signal integrity analysis of integrated circuits with semiconductor process variations | Joel R. Phillips, Igor Keller | 2014-01-14 |
| 8595669 | Flexible noise and delay modeling of circuit stages for static timing analysis of integrated circuit designs | Igor Keller, King-Ho Tam | 2013-11-26 |
| 8566760 | Method and apparatus for multi-die thermal analysis | Eddy Pramono, Yong Zhan | 2013-10-22 |
| 8543954 | Concurrent noise and delay modeling of circuit stages for static timing analysis of integrated circuit designs | Igor Keller, King-Ho Tam | 2013-09-24 |
| 8543952 | Method and apparatus for thermal analysis of through-silicon via (TSV) | Eddy Pramono, Yong Zhan | 2013-09-24 |
| 8533644 | Multi-CCC current source models and static timing analysis methods for integrated circuit designs | Igor Keller, Joel R. Phillips, King-Ho Tam | 2013-09-10 |
| 8516420 | Sensitivity and static timing analysis for integrated circuit designs using a multi-CCC current source model | Igor Keller, Joel R. Phillips, King-Ho Tam | 2013-08-20 |
| 8504958 | Method and apparatus for thermal analysis | Eddy Pramono, Yong Zhan | 2013-08-06 |
| 8201113 | Method and apparatus for multi-die thermal analysis | Eddy Pramono, Yong Zhan | 2012-06-12 |
| 8104006 | Method and apparatus for thermal analysis | Igor Keller, Eddy Pramono | 2012-01-24 |
| 8103996 | Method and apparatus for thermal analysis of through-silicon via (TSV) | Eddy Pramono, Yong Zhan | 2012-01-24 |
| 8104007 | Method and apparatus for thermal analysis | Eddy Pramono, Yong Zhan | 2012-01-24 |
| 7900166 | Method to produce an electrical model of an integrated circuit substrate and related system and article of manufacture | Xiaopeng Dong, David C. Noice | 2011-03-01 |
| 7882471 | Timing and signal integrity analysis of integrated circuits with semiconductor process variations | Joel R. Phillips, Igor Keller | 2011-02-01 |
| 7877713 | Method and apparatus for substrate noise analysis using substrate tile model and tile grid | Xiaopeng Dong, David C. Noice | 2011-01-25 |
| 6836873 | Static noise analysis with noise window estimation and propagation | Kenneth Tseng | 2004-12-28 |