Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9817068 | Method and system for improving efficiency of sequential test compression using overscan | Vivek Chickermane, Krishna Vijaya Chakravadhanula, Brian Foutz, Steev Wilcox, Paul Alexander Cunningham +2 more | 2017-11-14 |
| 9470754 | Elastic compression-optimizing tester bandwidth with compressed test stimuli using overscan and variable serialization | Vivek Chickermane, Krishna Vijaya Chakravadhanula, Brian Foutz, Steev Wilcox, Paul Alexander Cunningham +2 more | 2016-10-18 |
| 6611159 | Apparatus and method for synchronizing multiple circuits clocked at a divided phase locked loop frequency | Eric E. Retter, Roger S. Rutter, Michael Patrick Vachon | 2003-08-26 |
| 5694346 | Integrated circuit including fully testable small scale read only memory constructed of level sensitive scan device shift register latches | Michael Patrick Vachon | 1997-12-02 |