Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10222417 | Securing access to integrated circuit scan mode and data | Akhil Garg, Sahil Jain | 2019-03-05 |
| 9817068 | Method and system for improving efficiency of sequential test compression using overscan | Vivek Chickermane, Krishna Vijaya Chakravadhanula, Brian Foutz, Steev Wilcox, Paul Alexander Cunningham +2 more | 2017-11-14 |
| 9702934 | Reducing mask data volume with elastic compression | Vivek Chickermane | 2017-07-11 |
| 9470754 | Elastic compression-optimizing tester bandwidth with compressed test stimuli using overscan and variable serialization | Vivek Chickermane, Krishna Vijaya Chakravadhanula, Brian Foutz, Steev Wilcox, Paul Alexander Cunningham +2 more | 2016-10-18 |
| 9448282 | System and method for bit-wise selective masking of scan vectors for X-value tolerant built-in self test | — | 2016-09-20 |
| 8904256 | Method and apparatus for low-pin count testing of integrated circuits | Krishna Vijaya Chakravadhanula, Vivek Chickermane | 2014-12-02 |
| 8650524 | Method and apparatus for low-pin count testing of integrated circuits | Krishna Vijaya Chakravadhanula, Vivek Chickermane | 2014-02-11 |