Issued Patents All Time
Showing 51–65 of 65 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8037894 | Maintaining flow rate of a fluid | Rajesh Kelekar, Kurt H. Weiner | 2011-10-18 |
| 7962863 | Computer-implemented methods, systems, and computer-readable media for determining a model for predicting printability of reticle features on a wafer | Bo SU, Hong Du, Rui-fang Shi, Scott Sturges Andrews | 2011-06-14 |
| 7824935 | Methods of combinatorial processing for screening multiple samples on a semiconductor substrate | Kurt H. Weiner, Prashant B. Phatak, Imran Hashim, Sandra G. Malhotra, Tony P. Chiang | 2010-11-02 |
| 7689966 | Methods, systems, and carrier media for evaluating reticle layout data | Lance Glasser, Moshe E. Preil | 2010-03-30 |
| 7493590 | Process window optical proximity correction | Carl Hess, Ruifang Shi | 2009-02-17 |
| 7280945 | Apparatus and methods for detection of systematic defects | Kurt H. Weiner, Indranil De | 2007-10-09 |
| 7198963 | Methodologies for efficient inspection of test structures using electron beam scanning and step and repeat systems | Kurt H. Weiner | 2007-04-03 |
| 7067335 | Apparatus and methods for semiconductor IC failure detection | Kurt H. Weiner | 2006-06-27 |
| 6995393 | Apparatus and methods for semiconductor IC failure detection | Kurt H. Weiner | 2006-02-07 |
| 6861666 | Apparatus and methods for determining and localization of failures in test structures using voltage contrast | Kurt H. Weiner, Peter Nunan, Indranil De | 2005-03-01 |
| 6732002 | Apparatus and methods for predicting multiple product chip yields through critical area matching | Kurt H. Weiner | 2004-05-04 |
| 6642726 | Apparatus and methods for reliable and efficient detection of voltage contrast defects | Kurt H. Weiner, Isabella Talley Lewis | 2003-11-04 |
| 6387803 | Method for forming a silicide region on a silicon body | Somit Talwar, Karl-Josef Kramer, Kurt Weiner | 2002-05-14 |
| 6300208 | Methods for annealing an integrated device using a radiant energy absorber layer | Somit Talwar | 2001-10-09 |
| 6297135 | Method for forming silicide regions on an integrated device | Somit Talwar, Karl-Josef Kramer, Kurt Weiner | 2001-10-02 |