Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12298257 | Monolithic particle inspection device | Arjan Johannes Anton Beukman, Mohamed Swillam, Justin Kreuzer, Stephen Roux | 2025-05-13 |
| 12140875 | Metrology measurement method and apparatus | Han-Kwang Nienhuys, Teis Johan Coenen | 2024-11-12 |