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Bart Rijpers

AB Asml Netherlands B.V.: 1 patents #2,025 of 3,192Top 65%
Overall (All Time): #3,239,134 of 4,157,543Top 80%
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Patent #TitleCo-InventorsDate
7879682 Marker structure and method for controlling alignment of layers of a multi-layered substrate Richard Johannes Franciscus Van Haren, Arie Jeffrey Den Boef, Jacobus Burghoorn, Maurits Van Der Schaar 2011-02-01