JC

J. Fung Chen

AB Asml Masktools B.V.: 4 patents #15 of 37Top 45%
AB Asml Masktools Netherlands B.V.: 4 patents #2 of 9Top 25%
ME Microunity Systems Engineering: 1 patents #21 of 31Top 70%
UM United Microelectronics: 1 patents #2,686 of 4,560Top 60%
📍 Cupertino, CA: #1,595 of 6,989 inventorsTop 25%
🗺 California: #60,666 of 386,348 inventorsTop 20%
Overall (All Time): #521,543 of 4,157,543Top 15%
10
Patents All Time

Issued Patents All Time

Showing 1–10 of 10 patents

Patent #TitleCo-InventorsDate
7399559 Optical proximity correction method utilizing phase-edges as sub-resolution assist features Douglas Broeke 2008-07-15
7026081 Optical proximity correction method utilizing phase-edges as sub-resolution assist features Douglas Van Den Broeke 2006-04-11
6788400 Method and apparatus for detecting aberrations in an optical system 2004-09-07
6753954 Method and apparatus for detecting aberrations in a projection lens utilized for projection optics 2004-06-22
6482555 Method of patterning sub-0.25&lgr; line features with high transmission, “attenuated” phase shift masks Roger Caldwell, Tom Laidig, Kurt E. Wampler 2002-11-19
6335130 System and method of providing optical proximity correction for features using phase-shifted halftone transparent/semi-transparent features John S. Petersen 2002-01-01
6312854 "Method of patterning sub-0.25 lambda line features with high transmission, ""attenuated"" phase shift masks" Roger Caldwell, Tom Laidig, Kurt E. Wampler 2001-11-06
6114071 Method of fine feature edge tuning with optically-halftoned mask Kurt E. Wampler, Tom Laidig 2000-09-05
6115500 Method and device for compressing image data Chao-Shuenn Hsu 2000-09-05
5707765 Photolithography mask using serifs and method thereof 1998-01-13