Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10629427 | Bevel etch profile control | Vinay Prabhakar, Abdul Aziz Khaja, Jeongmin Lee | 2020-04-21 |
| 10599043 | Critical methodology in vacuum chambers to determine gap and leveling between wafer and hardware components | Hiroyuki Ogiso, Jianhua Zhou, Juan Carlos Rocha-Alvarez, Jeongmin Lee, Karthik Thimmavajjula Narasimha +4 more | 2020-03-24 |
| 10276364 | Bevel etch profile control | Vinay Prabhakar, Abdul Aziz Khaja, Jeongmin Lee | 2019-04-30 |