Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11366398 | Time-domain optical metrology and inspection of semiconductor devices | Gilad Barak, Michael Chemama, Smadar Ferber, Yanir Hainick, Boris Levant +3 more | 2022-06-21 |
| 7912657 | Method and system for providing a compensated auger spectrum | Dror Shemesh | 2011-03-22 |