RD

Ryan T. DOWNEY

Applied Materials: 2 patents #3,641 of 7,310Top 50%
Overall (All Time): #1,690,822 of 4,157,543Top 45%
2
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12203828 Method and system for detecting anomalies in a semiconductor processing system Hemant P. Mungekar, James L'HEUREUX, Andreas Neuber, Michael W. Johnson, Joseph A. VAN GOMPEL +5 more 2025-01-21
10861681 Apparatus for collection and subsequent reaction of liquid and solid effluent into gaseous effluent James L'HEUREUX, David Muquing HOU, Yan Rozenzon 2020-12-08