Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12148647 | Integrated substrate measurement system | Gregory John Freeman, Michael Kutney, Arunkumar Ramachandraiah, Chih Chung Chou, Zhaozhao Zhu +1 more | 2024-11-19 |
| 11582378 | Methods and apparatus for absolute and relative depth measurements using camera focus distance | Ozkan Celik, Gregory John Freeman, Paul Z. Wirth, Tommaso Vercesi | 2023-02-14 |
| 11189516 | Method for mask and substrate alignment | Greg Freeman, Ozkan Celik, Alexander Lerner | 2021-11-30 |
| 11032464 | Methods and apparatus for absolute and relative depth measurements using camera focus distance | Ozkan Celik, Gregory John Freeman, Paul Z. Wirth, Tommaso Vercesi | 2021-06-08 |
| 10498948 | Methods and apparatus for absolute and relative depth measurements using camera focus distance | Ozkan Celik, Gregory John Freeman, Paul Z. Wirth, Tommaso Vercesi | 2019-12-03 |