Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6413321 | Method and apparatus for reducing particle contamination on wafer backside during CVD process | Bok Hoen Kim, Mario D. Silvetti, Ameeta Madhava, Martin Jay Seamons, Emanuele Cappello +2 more | 2002-07-02 |
| 5464982 | Respiratory gas analyzer | Steven J. Drucker, Alexey Goder, Kevin Gregg Williams, Ken Christensen, Emery Major | 1995-11-07 |