CS

Chester A. Szwejkowski

Applied Materials: 4 patents #2,506 of 7,310Top 35%
SE Seiko Epson: 1 patents #5,551 of 7,774Top 75%
Overall (All Time): #1,294,094 of 4,157,543Top 35%
4
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
5338398 Tungsten silicide etch process selective to photoresist and oxide Robert Lum, Thierry Fried 1994-08-16
5296093 Process for removal of residues remaining after etching polysilicon layer in formation of integrated circuit structure Ian Latchford, Isamu Namose, Kazumi Tsuchida 1994-03-22
5228950 Dry process for removal of undesirable oxide and/or silicon residues from semiconductor wafer after processing Jennifer M. Webb, Zahra H. Amini 1993-07-20
5147499 Process for removal of residues remaining after etching polysilicon layer in formation of integrated circuit structure Ian Latchford, Isamu Namose, Kazumi Tsuchida 1992-09-15