Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12087383 | Virtualized scan chain testing in a random access memory (RAM) array | David Paul Hoff, Yeshwant Nagaraj Kolla, Rahul K. Nadkarni | 2024-09-10 |
| 10204698 | Method to dynamically inject errors in a repairable memory on silicon and a method to validate built-in-self-repair logic | Waseem Kraipak, Vijay Parmar, Mitrajit Chatterjee | 2019-02-12 |