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Dispatch engine for optimizing demand-response thermostat events |
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Experimental design for complex systems |
— |
2006-06-27 |
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Lot specific process design methodology |
— |
2004-03-16 |
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Feed-forward control of TCI doping for improving mass-production-wise statistical distribution of critical performance parameters in semiconductor devices |
Zoran Krivokapic |
2003-07-01 |
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Feed-forward control of TCI doping for improving mass-production-wise, statistical distribution of critical performance parameters in semiconductor devices |
Zoran Krivokapic |
2003-05-20 |
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Methods for identifying sources of patterns in processing effects in manufacturing |
— |
2002-05-14 |
| 6366822 |
Statistical process window design methodology |
— |
2002-04-02 |
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Worst case design parameter extraction for logic technologies |
Zoran Krivokapic |
2001-10-16 |
| 5966527 |
Apparatus, article of manufacture, method and system for simulating a mass-produced semiconductor device behavior |
Zoran Krivokapic |
1999-10-12 |
| 5946214 |
Computer implemented method for estimating fabrication yield for semiconductor integrated circuit including memory blocks with redundant rows and/or columns |
Richard Kittler, Ping Wen |
1999-08-31 |
| 5724251 |
System and method for designing, fabricating and testing multiple cell test structures to validate a cell library |
— |
1998-03-03 |
| 5655110 |
Method for setting and adjusting process parameters to maintain acceptable critical dimensions across each die of mass-produced semiconductor wafers |
Zoran Krivokapic, David F. Kyser |
1997-08-05 |
| 5646870 |
Method for setting and adjusting process parameters to maintain acceptable critical dimensions across each die of mass-produced semiconductor wafers |
Zoran Krivokapic, David F. Kyser |
1997-07-08 |
