William D. Heavlin — 13 Patents at AMD

William D. Heavlin has been granted 13 US patents while listed as an inventor at AMD. The first was granted in 1997 and the most recent in October 2018. William D. Heavlin ranks #362,438 of 4,157,543 US inventors in our database (top 8.7%). Patent records list William D. Heavlin in El Granada, CA, US.

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Showing 1–13 of 13 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
10101050	Dispatch engine for optimizing demand-response thermostat events	Ana Radovanovic, Wolf-Dietrich Weber, Ankit Somani, Seungil You, Matthew D. Wytock	2018-10-16	$22,774,000
7069196	Experimental design for complex systems	—	2006-06-27	$11,248,000
6708073	Lot specific process design methodology	—	2004-03-16	$3,543,000
6586755	Feed-forward control of TCI doping for improving mass-production-wise statistical distribution of critical performance parameters in semiconductor devices	Zoran Krivokapic	2003-07-01	$4,199,000
6567717	Feed-forward control of TCI doping for improving mass-production-wise, statistical distribution of critical performance parameters in semiconductor devices	Zoran Krivokapic	2003-05-20	$2,116,000
6389366	Methods for identifying sources of patterns in processing effects in manufacturing	—	2002-05-14	$2,737,000
6366822	Statistical process window design methodology	—	2002-04-02	$3,760,000
6304836	Worst case design parameter extraction for logic technologies	Zoran Krivokapic	2001-10-16	$3,616,000
5966527	Apparatus, article of manufacture, method and system for simulating a mass-produced semiconductor device behavior	Zoran Krivokapic	1999-10-12	$2,065,000
5946214	Computer implemented method for estimating fabrication yield for semiconductor integrated circuit including memory blocks with redundant rows and/or columns	Richard Kittler, Ping Wen	1999-08-31	$2,486,000
5724251	System and method for designing, fabricating and testing multiple cell test structures to validate a cell library	—	1998-03-03	$5,989,000
5655110	Method for setting and adjusting process parameters to maintain acceptable critical dimensions across each die of mass-produced semiconductor wafers	Zoran Krivokapic, David F. Kyser	1997-08-05	$8,420,000
5646870	Method for setting and adjusting process parameters to maintain acceptable critical dimensions across each die of mass-produced semiconductor wafers	Zoran Krivokapic, David F. Kyser	1997-07-08	$8,107,000

William D. Heavlin — 13 Patents

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