Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10101050 | Dispatch engine for optimizing demand-response thermostat events | Ana Radovanovic, Wolf-Dietrich Weber, Ankit Somani, Seungil You, Matthew D. Wytock | 2018-10-16 |
| 7069196 | Experimental design for complex systems | — | 2006-06-27 |
| 6708073 | Lot specific process design methodology | — | 2004-03-16 |
| 6586755 | Feed-forward control of TCI doping for improving mass-production-wise statistical distribution of critical performance parameters in semiconductor devices | Zoran Krivokapic | 2003-07-01 |
| 6567717 | Feed-forward control of TCI doping for improving mass-production-wise, statistical distribution of critical performance parameters in semiconductor devices | Zoran Krivokapic | 2003-05-20 |
| 6389366 | Methods for identifying sources of patterns in processing effects in manufacturing | — | 2002-05-14 |
| 6366822 | Statistical process window design methodology | — | 2002-04-02 |
| 6304836 | Worst case design parameter extraction for logic technologies | Zoran Krivokapic | 2001-10-16 |
| 5966527 | Apparatus, article of manufacture, method and system for simulating a mass-produced semiconductor device behavior | Zoran Krivokapic | 1999-10-12 |
| 5946214 | Computer implemented method for estimating fabrication yield for semiconductor integrated circuit including memory blocks with redundant rows and/or columns | Richard Kittler, Ping Wen | 1999-08-31 |
| 5724251 | System and method for designing, fabricating and testing multiple cell test structures to validate a cell library | — | 1998-03-03 |
| 5655110 | Method for setting and adjusting process parameters to maintain acceptable critical dimensions across each die of mass-produced semiconductor wafers | Zoran Krivokapic, David F. Kyser | 1997-08-05 |
| 5646870 | Method for setting and adjusting process parameters to maintain acceptable critical dimensions across each die of mass-produced semiconductor wafers | Zoran Krivokapic, David F. Kyser | 1997-07-08 |