Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11755804 | Hybrid synchronous and asynchronous control for scan-based testing | Albert Shih-Huai Lin, Niravkumar Patel, Amitava Majumdar | 2023-09-12 |
| 10969433 | Method to compress responses of automatic test pattern generation (ATPG) vectors into an on-chip multiple-input shift register (MISR) | Ismed D. Hartanto, Aaron K. Mathew | 2021-04-06 |