Issued Patents All Time
Showing 101–101 of 101 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5886909 | Defect diagnosis using simulation for IC yield improvement | Linda Milor, Yeng-Kaung Peng, David A. Steele | 1999-03-23 |
Showing 101–101 of 101 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5886909 | Defect diagnosis using simulation for IC yield improvement | Linda Milor, Yeng-Kaung Peng, David A. Steele | 1999-03-23 |