| 12225183 |
Icon-based home certification, in-home leakage testing, and antenna matching pad |
Terry W. Bush, Dexin Sun |
2025-02-11 |
| 12206557 |
Intelligent monitoring and testing system for cable network |
Robert J. Flask, Raleigh Benton Stelle, IV, Alvin R. RUTH |
2025-01-21 |
| 11856182 |
Icon-based home certification, in-home leakage testing, and antenna matching pad |
Terry W. Bush, Dexin Sun |
2023-12-26 |
| 11509954 |
CATV return band sweeping using data over cable service interface specification carriers |
Gary W. Sinde |
2022-11-22 |
| 11212517 |
Icon-based home certification, in-home leakage testing, and antenna matching pad |
Terry W. Bush, Dexin Sun |
2021-12-28 |
| 10771777 |
Icon-based home certification, in-home leakage testing, and antenna matching pad |
Terry W. Bush, Dexin Sun |
2020-09-08 |
| 10728539 |
Icon-based home certification, in-home leakage testing, and antenna matching pad |
Terry W. Bush, Dexin Sun |
2020-07-28 |
| 10623809 |
CATV return band sweeping using data over cable service interface specification carrier |
Gary W. Sinde |
2020-04-14 |
| 10116930 |
Icon-based home certification, in-home leakage testing, and antenna matching pad |
Terry W. Bush, Dexin Sun |
2018-10-30 |
| 10110888 |
Icon-based home certification, in-home leakage testing, and antenna matching pad |
Terry W. Bush, Dexin Sun |
2018-10-23 |
| 9667956 |
Icon-based home certification, in-home leakage testing, and antenna matching pad |
Terry W. Bush, Dexin Sun |
2017-05-30 |
| 9654218 |
RF ingress in fiber-to-the-premises |
Terry W. Bush, Gary W. Sinde |
2017-05-16 |
| 6977195 |
Test structure for characterizing junction leakage current |
Wen-Jie Qi, Robert H. Dawson |
2005-12-20 |
| 6469316 |
Test structure to monitor the effects of polysilicon pre-doping |
Mark I. Gardner, David E. Brown |
2002-10-22 |
| 6429052 |
Method of making high performance transistor with a reduced width gate electrode and device comprising same |
Mark I. Gardner, Frederick N. Hause |
2002-08-06 |
| 6380554 |
Test structure for electrically measuring the degree of misalignment between successive layers of conductors |
H. Jim Fulford, Mark I. Gardner |
2002-04-30 |
| 6359461 |
Test structure for determining the properties of densely packed transistors |
Jon D. Cheek, H. Jim Fulford |
2002-03-19 |
| 6191446 |
Formation and control of a vertically oriented transistor channel length |
Mark I. Gardner, Jon D. Cheek |
2001-02-20 |
| 6130454 |
Gate conductor formed within a trench bounded by slanted sidewalls |
Mark I. Gardner, Jon D. Cheek |
2000-10-10 |
| 6110786 |
Semiconductor device having elevated gate electrode and elevated active regions and method of manufacture thereof |
Mark I. Gardner, Jon D. Cheek |
2000-08-29 |
| 6075417 |
Ring oscillator test structure |
Jon D. Cheek, Antonio Torres Garcia |
2000-06-13 |
| 5986283 |
Test structure for determining how lithographic patterning of a gate conductor affects transistor properties |
Jon D. Cheek, Mark I. Gardner |
1999-11-16 |
| 5918128 |
Reduced channel length for a high performance CMOS transistor |
Mark I. Gardner |
1999-06-29 |
| D400038 |
Shelf |
Richard J. Herman |
1998-10-27 |
| D390728 |
Display shelf |
Richard J. Herman |
1998-02-17 |