Issued Patents All Time
Showing 1–25 of 25 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12225183 | Icon-based home certification, in-home leakage testing, and antenna matching pad | Terry W. Bush, Dexin Sun | 2025-02-11 |
| 12206557 | Intelligent monitoring and testing system for cable network | Robert J. Flask, Raleigh Benton Stelle, IV, Alvin R. RUTH | 2025-01-21 |
| 11856182 | Icon-based home certification, in-home leakage testing, and antenna matching pad | Terry W. Bush, Dexin Sun | 2023-12-26 |
| 11509954 | CATV return band sweeping using data over cable service interface specification carriers | Gary W. Sinde | 2022-11-22 |
| 11212517 | Icon-based home certification, in-home leakage testing, and antenna matching pad | Terry W. Bush, Dexin Sun | 2021-12-28 |
| 10771777 | Icon-based home certification, in-home leakage testing, and antenna matching pad | Terry W. Bush, Dexin Sun | 2020-09-08 |
| 10728539 | Icon-based home certification, in-home leakage testing, and antenna matching pad | Terry W. Bush, Dexin Sun | 2020-07-28 |
| 10623809 | CATV return band sweeping using data over cable service interface specification carrier | Gary W. Sinde | 2020-04-14 |
| 10116930 | Icon-based home certification, in-home leakage testing, and antenna matching pad | Terry W. Bush, Dexin Sun | 2018-10-30 |
| 10110888 | Icon-based home certification, in-home leakage testing, and antenna matching pad | Terry W. Bush, Dexin Sun | 2018-10-23 |
| 9667956 | Icon-based home certification, in-home leakage testing, and antenna matching pad | Terry W. Bush, Dexin Sun | 2017-05-30 |
| 9654218 | RF ingress in fiber-to-the-premises | Terry W. Bush, Gary W. Sinde | 2017-05-16 |
| 6977195 | Test structure for characterizing junction leakage current | Wen-Jie Qi, Robert H. Dawson | 2005-12-20 |
| 6469316 | Test structure to monitor the effects of polysilicon pre-doping | Mark I. Gardner, David E. Brown | 2002-10-22 |
| 6429052 | Method of making high performance transistor with a reduced width gate electrode and device comprising same | Mark I. Gardner, Frederick N. Hause | 2002-08-06 |
| 6380554 | Test structure for electrically measuring the degree of misalignment between successive layers of conductors | H. Jim Fulford, Mark I. Gardner | 2002-04-30 |
| 6359461 | Test structure for determining the properties of densely packed transistors | Jon D. Cheek, H. Jim Fulford | 2002-03-19 |
| 6191446 | Formation and control of a vertically oriented transistor channel length | Mark I. Gardner, Jon D. Cheek | 2001-02-20 |
| 6130454 | Gate conductor formed within a trench bounded by slanted sidewalls | Mark I. Gardner, Jon D. Cheek | 2000-10-10 |
| 6110786 | Semiconductor device having elevated gate electrode and elevated active regions and method of manufacture thereof | Mark I. Gardner, Jon D. Cheek | 2000-08-29 |
| 6075417 | Ring oscillator test structure | Jon D. Cheek, Antonio Torres Garcia | 2000-06-13 |
| 5986283 | Test structure for determining how lithographic patterning of a gate conductor affects transistor properties | Jon D. Cheek, Mark I. Gardner | 1999-11-16 |
| 5918128 | Reduced channel length for a high performance CMOS transistor | Mark I. Gardner | 1999-06-29 |
| D400038 | Shelf | Richard J. Herman | 1998-10-27 |
| D390728 | Display shelf | Richard J. Herman | 1998-02-17 |