Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 8761489 | Method and apparatus for characterizing discontinuities in semiconductor devices | Inka Richter, Clemens Fitz | 2014-06-24 | $2,752,000 |
| 7421060 | Method of determining an orientation of a crystal lattice of a first substrate relative to a crystal lattice of a second substrate | Inka Zienert, Thorsten Kammler | 2008-09-02 | $10,882,000 |