Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7994047 | Integrated circuit contact system | Christy Mei-Chu Woo, Ning Cheng | 2011-08-09 |
| 6770847 | Method and system for Joule heating characterization | Amit P. Marathe, Van-Hung Pham | 2004-08-03 |
| 6762613 | Testing system and method of operation therefor including a test fixture for electrical testing of semiconductor chips above a thermal threshold temperature of an interlayer dielectric material | Kurt Taylor | 2004-07-13 |