Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6964875 | Array of gate dielectric structures to measure gate dielectric thickness and parasitic capacitance | William G. En, Mark W. Michael, Simon S. Chan | 2005-11-15 |
| 6841832 | Array of gate dielectric structures to measure gate dielectric thickness and parasitic capacitance | William G. En, Mark W. Michael, Simon S. Chan | 2005-01-11 |
| 6713357 | Method to reduce parasitic capacitance of MOS transistors | Mark W. Michael, Wen-Jie Qi, William G. En, John G. Pellerin | 2004-03-30 |