Issued Patents All Time
Showing 101–125 of 138 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7571711 | Engine controller and controlling method | Shinji Nakagawa, Hiromu Kakuya, Toshimichi Minowa, Mamoru Nemoto | 2009-08-11 |
| 7461316 | Multi-strobe generation apparatus, test apparatus and adjustment method | Takashi Hasegawa, Masaru Doi | 2008-12-02 |
| 7447955 | Test apparatus and test method | Hirokatsu Niijima | 2008-11-04 |
| 7406646 | Multi-strobe apparatus, testing apparatus, and adjusting method | Satoshi Sudou, Masaru Doi | 2008-07-29 |
| 7378157 | Gas barrier film, and display substrate and display using the same | Osamu Sakakura, Minoru Komada | 2008-05-27 |
| 7363556 | Testing apparatus and testing method | Masaru Doi | 2008-04-22 |
| 7359822 | Testing device | Yuichi Fujiwara | 2008-04-15 |
| 7266738 | Test apparatus, phase adjusting method and memory controller | — | 2007-09-04 |
| 7216271 | Testing apparatus and a testing method | Kouichi Tanaka, Masaru Doi | 2007-05-08 |
| 7202618 | Inverter device | Akira Ide, Kazuki Najima, Motonobu Funato, Takashi Kawashima | 2007-04-10 |
| 7183828 | Shift clock generator, timing generator and test apparatus | — | 2007-02-27 |
| 7019812 | Liquid crystal optical element and an optical device | Nobuyuki Hashimoto | 2006-03-28 |
| 7010729 | Timing generator and test apparatus | Masaru Doi | 2006-03-07 |
| 6990613 | Test apparatus | Masaru Doi | 2006-01-24 |
| 6876431 | Liquid crystal optical element and an optical device | Nobuyuki Hashimoto | 2005-04-05 |
| 6817174 | Filtering means regenerating system for diesel engine | Tatsuki Igarashi, Masatoshi Shimoda, Mitsuru Hosoya, Hironobu Mogi, Hiroshi Hirabayashi | 2004-11-16 |
| 6807243 | Delay clock generating apparatus and delay time measuring apparatus | Toshiyuki Okayasu | 2004-10-19 |
| 6651179 | Delay time judging apparatus | Masatoshi Sato, Toshiyuki Okayasu | 2003-11-18 |
| 6597753 | Delay clock generating apparatus and delay time measuring apparatus | Toshiyuki Okayasu | 2003-07-22 |
| 6571353 | Fail information obtaining device and semiconductor memory tester using the same | — | 2003-05-27 |
| 6374378 | Failure analysis memory for semiconductor memory testing devices and its storage method | Katsuhiko Takano | 2002-04-16 |
| 6189957 | Electric device protecting structure | Hideyuki Matsui, Kazunori Osawa, Eiichirou Tanabe, Yoshihiro Nakajima, Masayuki Miyamoto +1 more | 2001-02-20 |
| 6154862 | Defect analysis memory for memory tester | Makoto Tabata | 2000-11-28 |
| 6122974 | Semiconductor type pressure sensor | Seikou Suzuki, Shinichi Yamaguchi, Yoshiyuki Sasada, Masayuki Miki, Masanori Kubota +1 more | 2000-09-26 |
| 6115833 | Semiconductor memory testing apparatus | Kenichi Fujisaki | 2000-09-05 |