| 11340026 |
Heat storage sheet |
Yuko Koseki |
2022-05-24 |
| 10968379 |
Heat-storage composition |
Yuko Koseki, Junichirou Koike, Kyouichi Toyomura |
2021-04-06 |
| 10619942 |
Heat storage molded body, heat storage laminate, and heat storage molded body production method |
Yuko Koseki |
2020-04-14 |
| 10502499 |
Heat storage molded body, heat storage laminate, and heat storage molded body production method |
Yuko Koseki |
2019-12-10 |
| 8677197 |
Test apparatus |
— |
2014-03-18 |
| 8325547 |
Test apparatus and repair analysis method |
— |
2012-12-04 |
| 8261139 |
Clear instruction information to indicate whether memory test failure information is valid |
— |
2012-09-04 |
| 7636877 |
Test apparatus having a pattern memory and test method for testing a device under test |
— |
2009-12-22 |
| 7529989 |
Testing apparatus and testing method |
— |
2009-05-05 |
| 7337381 |
Memory tester having defect analysis memory with two storage sections |
— |
2008-02-26 |
| 6173238 |
Memory testing apparatus |
— |
2001-01-09 |
| 6115833 |
Semiconductor memory testing apparatus |
Shinya Sato |
2000-09-05 |
| 6032281 |
Test pattern generator for memories having a block write function |
— |
2000-02-29 |
| 6006349 |
High speed pattern generating method and high speed pattern generator using the method |
— |
1999-12-21 |
| 5940875 |
Address pattern generator for burst address access of an SDRAM |
Toru Inagaki |
1999-08-17 |
| 5856985 |
Test pattern generator |
— |
1999-01-05 |
| 5852618 |
Multiple bit test pattern generator |
— |
1998-12-22 |
| 5835969 |
Address test pattern generator for burst transfer operation of a SDRAM |
Toru Inagaki |
1998-11-10 |
| 5831989 |
Memory testing apparatus |
— |
1998-11-03 |
| 5734660 |
Scan test circuit for use in semiconductor integrated circuit |
— |
1998-03-31 |
| 5481671 |
Memory testing device for multiported DRAMs |
— |
1996-01-02 |
| 5410687 |
Analyzing device for saving semiconductor memory failures |
Noboru Okino |
1995-04-25 |
| 4958345 |
Memory testing device |
— |
1990-09-18 |
| 4958346 |
Memory testing device |
— |
1990-09-18 |
