Kenichi Fujisaki — 24 Patents at Advantest

Kenichi Fujisaki has been granted 24 US patents while listed as an inventor at Advantest. The first was granted in 1990 and the most recent in May 2022. Kenichi Fujisaki ranks #168,038 of 4,157,543 US inventors in our database (top 4.0%). Patent records list Kenichi Fujisaki in Saitama, JP.

Issued Patents All Time

Showing 1–24 of 24 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
11340026	Heat storage sheet	Yuko Koseki	2022-05-24	$18,289,000
10968379	Heat-storage composition	Yuko Koseki, Junichirou Koike, Kyouichi Toyomura	2021-04-06
10619942	Heat storage molded body, heat storage laminate, and heat storage molded body production method	Yuko Koseki	2020-04-14
10502499	Heat storage molded body, heat storage laminate, and heat storage molded body production method	Yuko Koseki	2019-12-10
8677197	Test apparatus	—	2014-03-18	$54,000
8325547	Test apparatus and repair analysis method	—	2012-12-04	$50,000
8261139	Clear instruction information to indicate whether memory test failure information is valid	—	2012-09-04	$56,000
7636877	Test apparatus having a pattern memory and test method for testing a device under test	—	2009-12-22	$169,000
7529989	Testing apparatus and testing method	—	2009-05-05	$64,000
7337381	Memory tester having defect analysis memory with two storage sections	—	2008-02-26	$135,000
6173238	Memory testing apparatus	—	2001-01-09
6115833	Semiconductor memory testing apparatus	Shinya Sato	2000-09-05
6032281	Test pattern generator for memories having a block write function	—	2000-02-29
6006349	High speed pattern generating method and high speed pattern generator using the method	—	1999-12-21
5940875	Address pattern generator for burst address access of an SDRAM	Toru Inagaki	1999-08-17
5856985	Test pattern generator	—	1999-01-05
5852618	Multiple bit test pattern generator	—	1998-12-22
5835969	Address test pattern generator for burst transfer operation of a SDRAM	Toru Inagaki	1998-11-10
5831989	Memory testing apparatus	—	1998-11-03
5734660	Scan test circuit for use in semiconductor integrated circuit	—	1998-03-31	$9,911,000
5481671	Memory testing device for multiported DRAMs	—	1996-01-02
5410687	Analyzing device for saving semiconductor memory failures	Noboru Okino	1995-04-25
4958345	Memory testing device	—	1990-09-18
4958346	Memory testing device	—	1990-09-18

Kenichi Fujisaki — 24 Patents

Issued Patents All Time

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