Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8207744 | Testing apparatus | — | 2012-06-26 |
| 6877118 | Memory testing method and memory testing apparatus | Hiromi Oshima, Yasuhiro Kawata | 2005-04-05 |
| 6836863 | Semiconductor memory testing method and apparatus | Makoto Tabata | 2004-12-28 |
| 5410687 | Analyzing device for saving semiconductor memory failures | Kenichi Fujisaki | 1995-04-25 |
| 5140176 | Sequential logic circuit device | — | 1992-08-18 |
| 4670879 | Pattern generator | — | 1987-06-02 |