Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Test apparatus having a pattern memory and test method for testing a device under test

Test apparatus having a pattern memory and test method for testing a device under test

US Patent 7636877 · Granted Dec 22, 2009

Estimated economic value: $169,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Heat storage sheet2022
Heat-storage composition2021
Heat storage molded body, heat storage laminate, and heat storage molded body pr2020
Heat storage molded body, heat storage laminate, and heat storage molded body pr2019
Test apparatus2014
Test apparatus and repair analysis method2012
Clear instruction information to indicate whether memory test failure informatio2012
Testing apparatus and testing method2009
Memory tester having defect analysis memory with two storage sections2008
Memory testing apparatus2001
Semiconductor memory testing apparatus2000
Test pattern generator for memories having a block write function2000