Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8014969 | Test apparatus, test method and manufacturing method | Koji Hara, Noriyoshi Kozuka, Kohei Shibata, Tetsuya Sakaniwa | 2011-09-06 |
| 7447955 | Test apparatus and test method | Shinya Sato | 2008-11-04 |
| 7409615 | Test apparatus and test method | Hiroaki Nishimine, Takeo Miura | 2008-08-05 |
| 7262627 | Measuring apparatus, measuring method, and test apparatus | Tomoyuki Yamane | 2007-08-28 |
| 7197682 | Semiconductor test device and timing measurement method | — | 2007-03-27 |
| 7100099 | Test apparatus | — | 2006-08-29 |
| 7002334 | Jitter measuring apparatus and a testing apparatus | Kouichi Tanaka | 2006-02-21 |
| 6768954 | Jitter quantity calculator and tester | — | 2004-07-27 |
| 5955907 | Temperature compensation circuit and method for providing a constant delay | — | 1999-09-21 |
| 5732047 | Timing comparator circuit for use in device testing apparatus | — | 1998-03-24 |