Issued Patents 2025
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12327741 | Oscillating secondary stage for frame-mode overlay metrology | Izhar Agam, Andrew V. Hill, Yoram Uziel, Amnon Manassen | 2025-06-10 |
| 12253805 | Scatterometry overlay metrology with orthogonal fine-pitch segmentation | Vladimir Levinski, Amnon Manassen | 2025-03-18 |
| 12222199 | Systems and methods for measurement of misregistration and amelioration thereof | Roie Volkovich, Nachshon Rothman, Yossi Simon, Anna Golotsvan, Vladimir Levinski +3 more | 2025-02-11 |