| 12389629 |
Source/drain regions in integrated circuit structures |
Cory E. Weber |
2025-08-12 |
| 12376353 |
Source/drain regions in integrated circuit structures |
Andy Wei, Guillaume Bouche |
2025-07-29 |
| 12342614 |
Asymmetric gate structures and contacts for stacked transistors |
Cheng-Ying Huang, Patrick Morrow, Arunshankar Venkataraman, Willy Rachmady, Nicole K. Thomas +2 more |
2025-06-24 |
| 12328864 |
3D 1T1C stacked dram structure and method to fabricate |
Aaron D. Lilak, Abhishek A. Sharma |
2025-06-10 |
| 12328936 |
Gate spacing in integrated circuit structures |
Guillaume Bouche, Andy Wei |
2025-06-10 |
| 12288803 |
Transistor with isolation below source and drain |
Willy Rachmady, Cheng-Ying Huang, Matthew V. Metz, Nicholas G. Minutillo, Anand S. Murthy +3 more |
2025-04-29 |
| 12211898 |
Device contact sizing in integrated circuit structures |
Guillaume Bouche, Andy Wei |
2025-01-28 |
| 12191349 |
Reducing off-state leakage in semiconductor devices |
Dipanjan Basu, Cory E. Weber, Justin R. Weber, Harold W. Kennel, Seung Hoon Sung +3 more |
2025-01-07 |