Issued Patents 2025
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12416870 | Measuring method and measuring apparatus | Johan REININK, Jeroen COTTAAR, Sietse Thijmen Van Der Post | 2025-09-16 |
| 12366808 | Substrate holder, lithographic apparatus, device manufacturing method, and method of manufacturing a substrate holder | Raymond Wilhelmus Louis Lafarre, Nicolaas Ten Kate, Nina Vladimirovna Dziomkina, Yogesh Pramod Karade, Elisabeth Corinne Rodenburg | 2025-07-22 |
| 12353139 | Substrate holder and method of manufacturing a substrate holder | Raymond Wilhelmus Louis Lafarre, Nicolaas Ten Kate, Nina Vladimirovna Dziomkina, Yogesh Pramod Karade, Elisabeth Corinne Rodenburg | 2025-07-08 |
| 12287586 | Stage system, lithographic apparatus, method for positioning and device manufacturing method | Stef Marten Johan Janssens, Bert Dirk SCHOLTEN, Teunis Van Dam, Peter Mark Overschie, Theresa Mary Spaan-Burke +1 more | 2025-04-29 |