Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12175173 | Scattering measurement analysis method, scattering measurement analysis device, and non-transitory computer-readable storage medium storing scattering measurement analysis program | Kazuhiko Omote, Kazuki ITO, Tetsuya Ozawa | 2024-12-24 |
| 12009285 | Substrate having a recessed portion for an electronic component | Yoshitomo ONITSUKA | 2024-06-11 |