Issued Patents 2024
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12175173 | Scattering measurement analysis method, scattering measurement analysis device, and non-transitory computer-readable storage medium storing scattering measurement analysis program | Tomoyuki Iwata, Kazuki ITO, Tetsuya Ozawa | 2024-12-24 |
| 12019036 | Transmissive small-angle scattering device | Naoki Matsushima, Kiyoshi Ogata, Sei Yoshihara, Yoshiyasu Ito, Hiroshi Motono +3 more | 2024-06-25 |
| 11885753 | Imaging type X-ray microscope | Raita HIROSE, Shuichi Kato, Yuriy Platonov | 2024-01-30 |
| 11867646 | Total reflection x-ray fluorescence spectrometer | Makoto Kambe, Toshifumi Higuchi, Tsutomu Tada, Hajime Fujimura, Masahiro Nonoguchi +3 more | 2024-01-09 |