Issued Patents 2024
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12175173 | Scattering measurement analysis method, scattering measurement analysis device, and non-transitory computer-readable storage medium storing scattering measurement analysis program | Tomoyuki Iwata, Kazuhiko Omote, Tetsuya Ozawa | 2024-12-24 |