Issued Patents 2024
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12174131 | Quantitative analysis apparatus, method and program and manufacturing control system | Takahiro Kuzumaki, Miki Kasari, Akihiro Himeda, Atsushi Ohbuchi, Takayuki Konya | 2024-12-24 |
| 12175173 | Scattering measurement analysis method, scattering measurement analysis device, and non-transitory computer-readable storage medium storing scattering measurement analysis program | Tomoyuki Iwata, Kazuhiko Omote, Kazuki ITO | 2024-12-24 |
| 11942231 | Airtight box for measurement, airtight apparatus, measurement system and measurement apparatus | Koichiro Ito, Takeshi Ozawa | 2024-03-26 |