Issued Patents 2024
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12118705 | Automated optical inspection method, automated optical inspection system and storage medium | Cheng Gu, Chia-Yeh Lee | 2024-10-15 |
| 12044631 | Wafer surface defect inspection method and apparatus thereof | Miao Chen, Han-Zong Wu, Chia-Chi Tsai, I-Ching Li | 2024-07-23 |
| 11971365 | Wafer processing system and rework method thereof | Cheng-Jui Yang, Miao Chen, Han-Zong Wu | 2024-04-30 |
| 11859965 | Material analysis method | Wen-Ching Hsu, Chia-Chi Tsai, I-Ching Li | 2024-01-02 |