Issued Patents 2024
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12076677 | Method for collecting dust from single crystal growth system | Masami Nakanishi, Yu-Sheng Su | 2024-09-03 |
| 12044631 | Wafer surface defect inspection method and apparatus thereof | Shang-Chi Wang, Miao Chen, Han-Zong Wu, Chia-Chi Tsai | 2024-07-23 |
| 11923422 | Semiconductor device | Ming Hu, Chien-Jen Sun, Wen-Ching Hsu | 2024-03-05 |
| 11859965 | Material analysis method | Shang-Chi Wang, Wen-Ching Hsu, Chia-Chi Tsai | 2024-01-02 |