Issued Patents 2024
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12044631 | Wafer surface defect inspection method and apparatus thereof | Shang-Chi Wang, Miao Chen, Chia-Chi Tsai, I-Ching Li | 2024-07-23 |
| 12046474 | Wafer and manufacturing method of wafer | Chenghan Tsao | 2024-07-23 |
| 11971365 | Wafer processing system and rework method thereof | Shang-Chi Wang, Cheng-Jui Yang, Miao Chen | 2024-04-30 |