Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12044631 | Wafer surface defect inspection method and apparatus thereof | Shang-Chi Wang, Han-Zong Wu, Chia-Chi Tsai, I-Ching Li | 2024-07-23 |
| 11971365 | Wafer processing system and rework method thereof | Shang-Chi Wang, Cheng-Jui Yang, Han-Zong Wu | 2024-04-30 |