Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12044631 | Wafer surface defect inspection method and apparatus thereof | Shang-Chi Wang, Miao Chen, Han-Zong Wu, I-Ching Li | 2024-07-23 |
| 11859965 | Material analysis method | Shang-Chi Wang, Wen-Ching Hsu, I-Ching Li | 2024-01-02 |