Issued Patents 2024
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12124179 | Method of wafer alignment using at resolution metrology on product features | Hermanus Adrianus DILLEN, Marc Jurian Kea, Roy Werkman, Weitian Kou | 2024-10-22 |
| 12044979 | Computational metrology based sampling scheme | Yichen Zhang, Sarathi ROY | 2024-07-23 |
| 12044980 | Method of manufacturing devices | Abraham SLACHTER, Daan Maurits Slotboom, Vadim Yourievich TIMOSHKOV, Koen Wilhelmus Cornelis Adrianus Van Der Straten, Boris Menchtchikov +7 more | 2024-07-23 |
| 11972922 | Method for calibrating a scanning charged particle microscope | Hermanus Adrianus DILLEN, Willem Louis VAN MIERLO | 2024-04-30 |
| 11860548 | Method for characterizing a manufacturing process of semiconductor devices | Hermanus Adrianus DILLEN, Marc Jurian Kea, Mark John Maslow, Koen Thuijs, Peter David Engblom +3 more | 2024-01-02 |