Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12044979 | Computational metrology based sampling scheme | Wim Tjibbo Tel, Yichen Zhang | 2024-07-23 |
| 11994845 | Determining a correction to a process | Edo Maria Hulsebos, Roy Werkman, Junru RUAN | 2024-05-28 |