Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12124179 | Method of wafer alignment using at resolution metrology on product features | Wim Tjibbo Tel, Hermanus Adrianus DILLEN, Marc Jurian Kea, Weitian Kou | 2024-10-22 |
| 11994845 | Determining a correction to a process | Sarathi ROY, Edo Maria Hulsebos, Junru RUAN | 2024-05-28 |