Issued Patents 2024
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12124173 | Lithographic apparatus, metrology systems, illumination sources and methods thereof | Mohamed Swillam | 2024-10-22 |
| 12086973 | Detection apparatus for simultaneous acquisition of multiple diverse images of an object | Teunis Willem Tukker, Arie Jeffrey Den Boef, Nitesh Pandey, Ferry Zijp | 2024-09-10 |
| 11971663 | Light sources and methods of controlling; devices and methods for use in measurement applications | Hendrik Sabert, Patrick Sebastian Uebel | 2024-04-30 |
| 11940739 | Metrology apparatus | Nitesh Pandey, Arie Jeffrey Den Boef, Duygu Akbulut, Marinus Johannes Maria Van Dam, Hans Butler +4 more | 2024-03-26 |