Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11940739 | Metrology apparatus | Nitesh Pandey, Arie Jeffrey Den Boef, Marinus Johannes Maria Van Dam, Hans Butler, Hugo Augustinus Joseph Cramer +4 more | 2024-03-26 |
| 11927891 | Apparatus and methods for determining the position of a target structure on a substrate | Nitesh Pandey, Alessandro Polo, Sebastianus Adrianus GOORDEN | 2024-03-12 |