Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12013647 | Metrology method | Simon Gijsbert Josephus Mathijssen, Marc Johannes Noot, Kaustuve Bhattacharyya, Arie Jeffrey Den Boef, Grzegorz Grzela +4 more | 2024-06-18 |
| 11966168 | Method of measuring variation, inspection system, computer program, and computer system | Antoine Gaston Marie Kiers, Scott Anderson Middlebrooks | 2024-04-23 |