Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11754510 | Inspection system of semiconductor wafer and method of driving the same | Doyoung Yoon, Jeongho Ahn, Dongryul Lee, Dongchul Ihm | 2023-09-12 |
| 11754517 | Inspection apparatus for inspecting semiconductor devices using charged particles | Suyoung Lee, Jongmin Kim, Ilsuk Park, Kwangil Shin | 2023-09-12 |