Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11754517 | Inspection apparatus for inspecting semiconductor devices using charged particles | Suyoung Lee, Jongmin Kim, Ilsuk Park, Chungsam Jun | 2023-09-12 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11754517 | Inspection apparatus for inspecting semiconductor devices using charged particles | Suyoung Lee, Jongmin Kim, Ilsuk Park, Chungsam Jun | 2023-09-12 |