Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11754517 | Inspection apparatus for inspecting semiconductor devices using charged particles | Suyoung Lee, Jongmin Kim, Kwangil Shin, Chungsam Jun | 2023-09-12 |
IP
Ilsuk Park
Overall (2023): #415,712 of 537,848Top 80%
1
Patents 2023