Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11754510 | Inspection system of semiconductor wafer and method of driving the same | Jeongho Ahn, Dongryul Lee, Dongchul Ihm, Chungsam Jun | 2023-09-12 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11754510 | Inspection system of semiconductor wafer and method of driving the same | Jeongho Ahn, Dongryul Lee, Dongchul Ihm, Chungsam Jun | 2023-09-12 |